Resources / Publications
Samantha Rudinsky (1), Yu Yuan (1), Raynald Gauvin (1), Nicolas Piché (2), Mike Marsh (3)
Microscopy and Microanalysis, 25, Supplement 2, August 2019: 222-223. DOI: 10.1017/S1431927619001843
Characterization by electron microscopy plays a crucial role in research across a variety of materials research applications because it can be used to discern the physical and chemical properties of the studied materials. However, in order to make large scale assessments of new products and structures, such techniques need to be automated and optimized so that large amounts of data may be processed efficiently. Optimization can sometimes be done empirically by varying imaging conditions on an available microscope, but when those imaging conditions can be varied through simulation, it is easier to test more systematically a wider variety of conditions. MC X-ray is such a simulation tool which can compute the complete backscattered electron (BSE) images and x-ray spectra from the simulation of electron scattering in solids of various geometries. Until recently, the flexibility of simulated sample domains was constrained by limits in the MC X-ray user interface. We present here the integration of the simulation technology of MC X-ray in a feature-rich graphical image processing and image visualization platform, enabling greater user flexibility and the capability to use previously collected images as the initial spatial domain of simulation.
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