In situ observation of phase separation and hierarchical microstructure of KxFe2-ySe2 single crystals
Yong Liu(a), Qingfeng Xing(a), Warren E. Straszheim(a,b), Jeff Marshman(c), Pal Pedersen(d), Thomas A. Lograsso(a,e).
ArXiv e-prints. 2015 February.
The 3D microstructure was produced by focused Ion Beam Scanning Electron Microscopy (FIB‐SEM) using the Carl Zeiss Crossbeam 540 system. The data was reconstructed by use of ORS Visual Advanced SI 3D Visualization software.
With the successive milling and imaging process, a series of SEM images were obtained. The recorded images were stacked into a dataset. Handling and visualization of three‐dimensional datasets is straightforward with image analysis software, ORS Visual SI Advanced. A volume of 16x10x10 µm3 (16x10 µm2 for the cross section and 10 µm along slicing direction) was reconstructed with the data treatment.
(a) Division of Materials Sciences and Engineering, Ames Laboratory, US DOE, Ames, Iowa 50011, USA
(b) Materials Analysis and Research Laboratory, Iowa State University, Ames, Iowa 50011, USA
(c) Carl Zeiss Microscopy, LLC, Ion Microscopy Innovation Center (IMIC), Peabody, Massachusetts 01960, USA
(d) Carl Zeiss Microscopy, LLC, Thornwood, New York 10594, USA
(e) Centre de recherche du Centre Hospitalier de l’Université de Montréal (CRCHUM)
(f) Department of Materials Science and Engineering, Iowa State University, Ames, Iowa 50011, USA
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